A by-inspection analysis of SC networks using direct topological rules

J. J. Mulawka; G. S. Moschytz; J. J. Mulawka

doi:10.1049/ip-g-1.1985.0052

A by-inspection analysis of SC networks using direct topological rules

J. J. Mulawka, G. S. Moschytz, J. J. Mulawka

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The paper describes an extension of Moschytz and Brugger’s signal-flow graph analysis of switched capacitor (SC) networks. The approach is based on the application of the ‘direct topological rules’ of graph theory. The method enables speedy hand analysis of general SC networks of medium complexity, and is especially effective for the analysis of passive SC circuits. To become familiar with the writing by-inspection of the driving-point and transfer functions, the first part of the paper briefly reviews the direct analysis of reciprocal networks.

Original language	English
Pages (from-to)	255-265
Number of pages	11
Journal	IEE Proceedings, Part G: Electronic Circuits and Systems
Volume	132
Issue number	6
DOIs	https://doi.org/10.1049/ip-g-1.1985.0052
State	Published - 1985
Externally published	Yes

Keywords

Circuit theory and design
Graph theory and topology
Networks
Topology

Access to Document

10.1049/ip-g-1.1985.0052

Cite this

@article{0aaabc32036b48d48f18bb8e0855317c,

title = "A by-inspection analysis of SC networks using direct topological rules",

abstract = "The paper describes an extension of Moschytz and Brugger{\textquoteright}s signal-flow graph analysis of switched capacitor (SC) networks. The approach is based on the application of the {\textquoteleft}direct topological rules{\textquoteright} of graph theory. The method enables speedy hand analysis of general SC networks of medium complexity, and is especially effective for the analysis of passive SC circuits. To become familiar with the writing by-inspection of the driving-point and transfer functions, the first part of the paper briefly reviews the direct analysis of reciprocal networks.",

keywords = "Circuit theory and design, Graph theory and topology, Networks, Topology",

author = "Mulawka, {J. J.} and Moschytz, {G. S.} and Mulawka, {J. J.}",

year = "1985",

doi = "10.1049/ip-g-1.1985.0052",

language = "אנגלית",

volume = "132",

pages = "255--265",

journal = "IEE Proceedings, Part G: Electronic Circuits and Systems",

issn = "0143-7089",

publisher = "Institute of Electrical Engineers",

number = "6",

}

TY - JOUR

T1 - A by-inspection analysis of SC networks using direct topological rules

AU - Mulawka, J. J.

AU - Moschytz, G. S.

AU - Mulawka, J. J.

PY - 1985

Y1 - 1985

N2 - The paper describes an extension of Moschytz and Brugger’s signal-flow graph analysis of switched capacitor (SC) networks. The approach is based on the application of the ‘direct topological rules’ of graph theory. The method enables speedy hand analysis of general SC networks of medium complexity, and is especially effective for the analysis of passive SC circuits. To become familiar with the writing by-inspection of the driving-point and transfer functions, the first part of the paper briefly reviews the direct analysis of reciprocal networks.

AB - The paper describes an extension of Moschytz and Brugger’s signal-flow graph analysis of switched capacitor (SC) networks. The approach is based on the application of the ‘direct topological rules’ of graph theory. The method enables speedy hand analysis of general SC networks of medium complexity, and is especially effective for the analysis of passive SC circuits. To become familiar with the writing by-inspection of the driving-point and transfer functions, the first part of the paper briefly reviews the direct analysis of reciprocal networks.

KW - Circuit theory and design

KW - Graph theory and topology

KW - Networks

KW - Topology

UR - http://www.scopus.com/inward/record.url?scp=0022244509&partnerID=8YFLogxK

U2 - 10.1049/ip-g-1.1985.0052

DO - 10.1049/ip-g-1.1985.0052

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:0022244509

SN - 0143-7089

VL - 132

SP - 255

EP - 265

JO - IEE Proceedings, Part G: Electronic Circuits and Systems

JF - IEE Proceedings, Part G: Electronic Circuits and Systems

IS - 6

ER -

A by-inspection analysis of SC networks using direct topological rules

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this