A 4T GC-eDRAM Bitcell with Differential Readout Mechanism For High Performance Applications

Roman Golman, Avinoam Segev, Adam Teman

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Gain-cell embedded DRAM (GC-eDRAM) is a dense, low power option for embedded memory implementation, supporting low supply voltages. However, due to its structure, the readout scheme is slow and requires a high precision external reference voltage to improve performance. In this work, we propose a novel bitcell featuring a differential readout mechanism for high frequency operation without the need for an external voltage supply. A 16 kbit memory macro was implemented in 65nm CMOS bulk technology offering up to 3x improvement in access time compared to standard GC-eDRAM solutions and similar read time to SRAM bitcells, while providing up-to 30% reduction in bitcell area compared to standard SRAM solution.

Original languageEnglish
Title of host publication2024 19th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350386301
DOIs
StatePublished - 2024
Event19th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2024 - Larnaca, Cyprus
Duration: 9 Jun 202412 Jun 2024

Publication series

Name2024 19th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2024

Conference

Conference19th Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2024
Country/TerritoryCyprus
CityLarnaca
Period9/06/2412/06/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • GC-eDRAM
  • Low Power
  • differential readout
  • embedded Memory
  • gain cells
  • logic-compatible eDRAM

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