Abstract
We present an all-digital voltage droop monitor (VDM) with coupled ring-oscillators (CoRO) for accurate in-situ droop monitoring every clock cycle. Measurements from a 3.2mm2 testchip in Intel 4 CMOS containing 9 3-way CoRO and baseline RO VDMs demonstrate 3X improvement in CoRO resolution (∼ 2.6 mV/b) over the baseline. In addition, measurements show 3 σ uncertainty (repeatability) error of CoRO VDM (+/-9mV) is ∼25 % lower than the baseline. The overall droop detection error improvements achieved by CoRO VDM are 12mV, 15mV and 17mV, respectively, depending on the type of calibration used - per instance/temperature/die, per temperature/die, or per die. This corresponds to associated IP power savings of 2.9%, 3.2% and 3.7% during functional use.
Original language | English |
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Title of host publication | 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9784863488069 |
DOIs | |
State | Published - 2023 |
Externally published | Yes |
Event | 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 - Kyoto, Japan Duration: 11 Jun 2023 → 16 Jun 2023 |
Publication series
Name | Digest of Technical Papers - Symposium on VLSI Technology |
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Volume | 2023-June |
ISSN (Print) | 0743-1562 |
Conference
Conference | 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 |
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Country/Territory | Japan |
City | Kyoto |
Period | 11/06/23 → 16/06/23 |
Bibliographical note
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