Keyphrases
Information Leakage
69%
Robust Codes
57%
Side-channel Attacks
51%
Checkers
48%
Error Detection
48%
Fault Injection Attack
48%
Instruction Stream
46%
Physical Unclonable Function
46%
Nonlinear Codes
46%
Control Flow Checking
46%
Multilevel Memory
46%
Error-detecting Codes
42%
Attacker
42%
Redundant Bits
40%
Adversary
38%
Mutual Information
36%
Control Flow
34%
Code-based
34%
Jamming
34%
Power Traces
34%
Area Overhead
30%
Error Masking Probability
30%
Circuit Level
28%
Latency Overhead
23%
Error-detecting
23%
Fine-grained Control
23%
Inner Product Masking
23%
Higher-order Masking
23%
Israel
23%
Security Enhancement
23%
Configurable Logic Block
23%
Reduced Information
23%
Error Control Scheme
23%
Energy Overhead
23%
6T-SRAM
23%
Converter Design
23%
Constructive Bound
23%
Cryptographic Primitives
23%
Side Channel
23%
Power Attack
23%
Low Overhead
23%
Power Redistribution
23%
Security Hazards
23%
Resilience
23%
Q-ary
23%
Memory Cell
23%
Monitoring Method
23%
Control Flow Monitoring
23%
Linear Encoder
23%
Hardware Efficiency
23%
Computer Science
Fault Injection
100%
Error Detection
76%
side-channel
69%
Information Leakage
65%
Error Control
46%
Control Flow
46%
Experimental Result
46%
Attackers
46%
Multilevel Memory
46%
Memory Array
46%
Injected Fault
42%
security level
40%
Mutual Information
40%
Power Analysis
28%
Instruction Stream
26%
Cryptographic Primitive
23%
Cryptographic Module
23%
Grained Control
23%
Code Efficiency
23%
Configurable Logic Block
23%
Channel Analysis
23%
Environmental Variation
23%
Clock Period
23%
Cryptographic Device
23%
Hardware Security
23%
Information Power
23%
Process Variation
23%
Transmitted Signal
23%
Data Manipulation
23%
Side Channel
23%
Parallel Channel
23%
Error Correction
15%
Linear Encoders
13%
Physical Fault
11%
Electronic System
11%
Arbitrary Number
11%
Multiplicity
11%
Minimal Distance
11%
Hardware Implementation
11%
Analytical Tool
11%
Hypothesis Space
11%
System on a Chip
11%
Attack Resistance
7%
Execution Time
7%
Analog Voltage
7%
Cross-Coupled Inverter
7%
Information Leak
7%
Variable Length
5%
embedded memory
5%
Protection Mechanism
5%