Equipments Details
Description
Oxford Instruments MAXXI 6 X-ray Fluorescence (XRF) analyzer for coating thickness and materials analysis. The MAXXI 6 uses a high-resolution SDD detector capable of measuring coatings down to the nanoscale and element composition at trace level.
Specifications:
- Analyzing solids or liquids over a wide element range from 13Al to 92U
- Programmable XY stage
- Internal volume (w x d x h): 500 mm x 450 mm x 170 mm
- Easy load feature with prepositioning laser
- Automated measurement
- Intuitive Windows™ 7 based MaxxControl software
- Choice of empirical calibrations for highest accuracy or FP
- Model for easy calibration
- Free selection of elements for composition analysis and
- Free definable layer structure for thickness analysis
- Factory preloaded calibration for RoHS and precious
- Metals (optional)
Contact Person:
Mark Oksman
https://nano.biu.ac.il/oksman
Specifications:
- Analyzing solids or liquids over a wide element range from 13Al to 92U
- Programmable XY stage
- Internal volume (w x d x h): 500 mm x 450 mm x 170 mm
- Easy load feature with prepositioning laser
- Automated measurement
- Intuitive Windows™ 7 based MaxxControl software
- Choice of empirical calibrations for highest accuracy or FP
- Model for easy calibration
- Free selection of elements for composition analysis and
- Free definable layer structure for thickness analysis
- Factory preloaded calibration for RoHS and precious
- Metals (optional)
Contact Person:
Mark Oksman
https://nano.biu.ac.il/oksman
Details
Name | MAXXI 6 X-ray Fluorescence (XRF) analyzer |
---|---|
Manufacturers | Oxford Instruments Group Plc |

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