Stylus Profiler

The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds.

Specifications:

- Max Scan length 55 mm
- 12.5 μm tip radius
- 0.03-15 mg variable stylus force
- Vertical repeatability = 4Å on 0.1 um step
- Vertical range: 1 mm
- Max sample thickness: 50 mm / max sample diameter: 8"

https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektakxt.html