Spectroscopic Reflectometer [NanoCalc, Ocean Optics]

  • Yossi Abulafia (Manager)

Equipment/facility: Equipment

    Equipments Details

    Description

    The NanoCalc Thin Film Reflectometry System allows researchers to analyze the thickness of optical layers from 1 nm to 250 ┬Ám.

    Specifications:

    - Thickness resolution of 0.1 nm
    - 3 kinds of probes (standalone probe, microscope probe for microstructures measurements and transmission
    - Single-Layer or Multilayer films
    - Wavelength range 230-1100nm

    Details

    NameNanoCalc
    ManufacturersOcean Optics, Inc.

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