Equipments Details
Description
The NanoCalc Thin Film Reflectometry System allows researchers to analyze the thickness of optical layers from 1 nm to 250 µm.
Specifications:
- Thickness resolution of 0.1 nm
- 3 kinds of probes (standalone probe, microscope probe for microstructures measurements and transmission
- Single-Layer or Multilayer films
- Wavelength range 230-1100nm
Specifications:
- Thickness resolution of 0.1 nm
- 3 kinds of probes (standalone probe, microscope probe for microstructures measurements and transmission
- Single-Layer or Multilayer films
- Wavelength range 230-1100nm
Details
| Name | NanoCalc |
|---|---|
| Manufacturers | Ocean Optics, Inc. |
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