Equipments Details
Description
Woollam M-2000 is a spectroscopic ellipsometer capable of extracting thickness and index of refraction for transparent and semi-transparent thin films or coatings. It is equipped with fully automated sample alignment with stage tip/tilt and focus. It has a high-speed CCD detector for collection of data across the full spectral range of 193-1683 nm simultaneously. Typical acquisition time is 5 sec per site per angle.
Specifications:
- Wavelength range 190-1700 nm
- Focusing probs – spot size ~50 μm
- Automatic surface mapping and variable angle measurement
https://www.jawoollam.com/products/m-2000-ellipsometer
Contact Person:
Mark Oksman
https://nano.biu.ac.il/oksman
Specifications:
- Wavelength range 190-1700 nm
- Focusing probs – spot size ~50 μm
- Automatic surface mapping and variable angle measurement
https://www.jawoollam.com/products/m-2000-ellipsometer
Contact Person:
Mark Oksman
https://nano.biu.ac.il/oksman
Details
| Name | M-2000 spectroscopic ellipsometer |
|---|---|
| Manufacturers | J. A. Woolam |
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