Equipments Details
Description
The High Resolution Transmission Electron Microscope, JEM 2100, JEOL is being used for 2D nano scale imaging of various samples from the field of material science.
Specifications
Accelerating Voltage 200kV
Gatan USC 4000 4x4k camera
Specimen tilt +/-70°
Double Tilt (+/- 45°) Vacuum Transfer Holder
Detectors: BF/DF STEM, EDS, 3D Tomography
Resolution 0.23 nm (point to point), 0.14 nm (lattice)
Specifications
Accelerating Voltage 200kV
Gatan USC 4000 4x4k camera
Specimen tilt +/-70°
Double Tilt (+/- 45°) Vacuum Transfer Holder
Detectors: BF/DF STEM, EDS, 3D Tomography
Resolution 0.23 nm (point to point), 0.14 nm (lattice)
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