HR-SEM, Magellan 400L

  • Olga Girshevitz (Manager)

Equipment/facility: Equipment

    Equipments Details


    XHR-SEM –High Resolution Scanning Electron Microscope, FEI, Magellan 400Lis used for morphology and topography analysis at resolutions down to 0.6nm.

    Field Emission Gun (Schottky field emitter UC (UniCore))
    High vacuum
    Detectors: TLD, Vcd, SE, EDS, EBSD, STEM
    Resolution 0.6nm


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