HR-SEM, Magellan 400L

  • Olga Girshevitz (Manager)
Bar Ilan's Institute for Nanotechnology and Advanced Materials (BINA)

Equipment/facility: Equipment

    Equipments Details

    Description

    XHR-SEM –High Resolution Scanning Electron Microscope, FEI, Magellan 400Lis used for morphology and topography analysis at resolutions down to 0.6nm.

    Specifications:
    Field Emission Gun (Schottky field emitter UC (UniCore))
    High vacuum
    Detectors: TLD, Vcd, SE, EDS, EBSD, STEM
    Resolution 0.6nm

    Contact Information

    Web addressesWebsite

    Equipment hierarchy

    Electron Microscopy / Charged-Particle Microscopy (CPM) - BINA
    HR-SEM, Magellan 400L

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