Equipments Details
Description
Environmental Scanning Electron Microscope, Ouanta FEG 250, FEI.
Used for morphology and topography analysis at resolutions down to 1.2nm. The uniuqeness of the E-SEM is the ability to perform the measurement under humid and LV conditions in adition to the standart HV conditions. The use of Field Emission Gun (FEG) is significantly improved signal to noise ratio and spatial resolution and therefore enable to obtain a better latteral resolution.
Specifications
Field Emission Gun (Schottky field emitter)
High/low vacuum
High vacuum with beam deceleration
Extended vacuum mode (wet-ESEM)
High and low temperature imaging in the range of -20°C - +1000°C
Detectors: SE, BSED, vCD, EDS, STEM
Resolution 1.2nm
Instrument Information:
https://elecmi.es/en/sem-quanta-feg-250-esem/
Used for morphology and topography analysis at resolutions down to 1.2nm. The uniuqeness of the E-SEM is the ability to perform the measurement under humid and LV conditions in adition to the standart HV conditions. The use of Field Emission Gun (FEG) is significantly improved signal to noise ratio and spatial resolution and therefore enable to obtain a better latteral resolution.
Specifications
Field Emission Gun (Schottky field emitter)
High/low vacuum
High vacuum with beam deceleration
Extended vacuum mode (wet-ESEM)
High and low temperature imaging in the range of -20°C - +1000°C
Detectors: SE, BSED, vCD, EDS, STEM
Resolution 1.2nm
Instrument Information:
https://elecmi.es/en/sem-quanta-feg-250-esem/
Details
| Name | Quanta FEG 250 |
|---|---|
| Manufacturers | ELECMI |
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