Characterization Unit, MIXA (Electron Microscopy, Ion Beam Analysis, X-ray Diffraction, Atomic Force Microscopy)

At the heart of the BINA Center, our Characterization Unit (Electron Microscopy, Ion Beam Analysis, X-ray Diffraction, and Atomic Force Microscopy, MIXA) is dedicated to advancing cutting-edge research through state-of-the-art analytical techniques. Our mission is to provide researchers with unparalleled access to a diverse range of tools, enabling in-depth investigations into nanomaterials and biological samples. We aim to be a hub for precision analysis, driving advancements in nanoscience and technology, fostering interdisciplinary collaborations, and contributing to groundbreaking discoveries.