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Conference Contributed
Zalevsky, Z.
(Invited speaker)
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
Electro-Optics
Activity
:
Talk or presentation
›
Invited talk
Period
1 May 2011
Event title
SPIE Europe meeting, Conference 8082, Optical Measurement Systems for Industrial Inspection VII
Event type
Conference
Location
Munich, Germany
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