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Conference Contributed
Zalevsky, Z.
(Invited speaker)
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
Electro-Optics (BIU Engineering)
Activity
:
Talk or presentation
›
Invited talk
Period
1 Jul 2009
Event title
16th IEEE international symposium on the physical and failure analysis of integrated circuits (IPFA)
Event type
Conference
Location
Suzhou, China
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